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Reflective Index and Thin Film Thickness Measurement System
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Reflective Index and Thin Film Thickness Measurement System

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Product Description
High Quality, Competitively Priced Reflective Index and Thin Film Thickness Measurement System is intended specially for precise refractive index measurement. Based on Dual Reflectometer, this instrument allows to measure not only normal vertical reflectance, but also incident one. Besides it can be applied to measure thin film thickness. Please, contact us for specifications.
Reflective Index and Thin Film Thickness Measurement System
SUPPLIER PROFILE
Company: Korea Materials & Analysis Corp.
City/State Taejeon, Korea Country: Korea - Republic of  
Business Type: Export - Manufacturer / Trading Company Established: 1996
Member Since: 2000 Contact Person Ms. Vinogradova
SUPPLIER PROFILE
City/State/Country -
Taejeon, Korea
Korea - Republic of  
Business Type -
Export - Manufacturer / Trading Company
Established -
1996
Member Since -
2000
Contact Person -
Ms. Vinogradova